Am. J. Bot. -- Index by Author (December 2006, Volume 93, Number 12)

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	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: December 2006; 93 (12) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Aoki, Kyoko [Abstract] [Full Text]
B: Brown, J. Jed [Abstract] [Full Text]
C: Caddy, H. A. R. [Abstract] [Full Text]; Calviño, Carolina I. [Abstract] [Full Text]; Chase, Mark W. [Abstract] [Full Text]; Cheely, George [Abstract] [Full Text]; Curtis, John D. [Abstract] [Full Text]; Czlapinski, Albert R. [Abstract] [Full Text]
D: De Moraes, Consuelo M. [Abstract] [Full Text]; DeVore, Melanie L. [Abstract] [Full Text]; Downie, Stephen R. [Abstract] [Full Text]; Duangjai, Sutee [Abstract] [Full Text]; Dudash, Michele R. [Abstract] [Full Text]; Dudley, Leah S. [Abstract] [Full Text]
F: Fenster, Charles B. [Abstract] [Full Text]; Ferrari, Matthew J. [Abstract] [Full Text]; Freckmann, Robert [Abstract] [Full Text]
G: Glenn, Edward P. [Abstract] [Full Text]; Gross, C. L. [Abstract] [Full Text]; Guntenspergen, Glenn R. [Abstract] [Full Text]
H: Hattori, Tamotsu [Abstract] [Full Text]; Horner, Harry T. [Abstract] [Full Text]
K: Kenrick, Paul [Abstract] [Full Text]; Ketcham, Richard A. [Abstract] [Full Text]; Knouft, Jason H. [Abstract] [Full Text]
L: Lersten, Nels R. [Abstract] [Full Text]
M: Matsumura, Toshikazu [Abstract] [Full Text]; Mescher, Mark C. [Abstract] [Full Text]; Miller, Allison J. [Abstract] [Full Text]; Munzinger, Jérôme [Abstract] [Full Text]; Murakami, Noriaki [Abstract] [Full Text]
N: Nelson, Stephen G. [Abstract] [Full Text]
P: Pigg, Kathleen B. [Abstract] [Full Text]
R: Reynolds, Richard J. [Abstract] [Full Text]
S: Samuel, Rosabelle [Abstract] [Full Text]; Scofield, Douglas G. [Abstract] [Full Text]; Sogo, Akiko [Abstract] [Full Text]; Stephenson, Andrew G. [Abstract] [Full Text]
T: Tilney, Patricia M. [Abstract] [Full Text]; Tobe, Hiroshi [Abstract] [Full Text]
V: Vasquez, Edward A. [Abstract] [Full Text]
W: Wallnöfer, Bruno [Abstract] [Full Text]; Wyk, Ben-Erik van [Abstract] [Full Text]